Gene action of yield and its contributing traits in wide-compatible elite rice (Oryza sativa L.) restorer lines

Authors

DOI:

https://doi.org/10.18006/2024.12(6).850.859

Keywords:

Wide compatibility, Generation mean analysis, Scaling test, Gene action, Genetic effects

Abstract

Profiling the genetic architecture of quantitative traits, such as yield and its contributing factors, is essential for successful breeding programs. Understanding the genetic components of variation is key to maximizing genetic gains with precision in crop improvement. This study evaluated the genetics of yield and its related traits through generation mean analysis in six generations (P1, P2, F1, F2, B1, and B2) of crosses involving elite restorer lines. Results from the scaling tests indicated that epistatic interactions were present for all traits examined, except for effective tillers per plant in crosses I (CR 22-153-1 x Lemont) and II (CR 22-153-1 x CR 22-1-5-1). The six-parameter analysis showed a combination of additive, dominance, and epistatic gene effects, although their contributions varied. In both crosses, the additive or fixable variance was consistently lower than the non-additive variance for most yield-related traits. Among the genetic effects, the dominance effect (h) and the dominance × dominance effect were significantly higher for most traits in both crosses. However, the values of these effects often exhibited opposite signs for different traits, underscoring the importance of duplicate epistasis in the inheritance and expression of these traits. The predominance of dominance, interaction effects, and duplicate epistasis across all studied traits and crosses limits the potential for early generation selection. Nevertheless, bi-parental matings between superior segregants may help disrupt undesirable linkages and produce favorable segregants with an accumulation of positive alleles for trait development.

Author Biographies

Kalpataru Nanda, Visva-Bharati, Santiniketan,West Bengal, India

Visva-Bharati, Santiniketan,West Bengal, India

Nihar Ranjan Chakraborty, Visva-Bharati, Santiniketan,West Bengal, India

Visva-Bharati, Santiniketan,West Bengal, India

Debarchana Jena, ICAR-National Rice Research Institute, Cuttack, Odisha, India

ICAR-National Rice Research Institute, Cuttack, Odisha, India

Diptibala Rout, ICAR-National Rice Research Institute, Cuttack, Odisha, India

ICAR-National Rice Research Institute, Cuttack, Odisha, India

Ramlakhan Verma, ICAR-National Rice Research Institute, Cuttack, Odisha, India

ICAR-National Rice Research Institute, Cuttack, Odisha, India

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Published

2025-01-15

How to Cite

Nanda, K., Chakraborty, N. R., Jena, D., Rout, D., & Verma, R. (2025). Gene action of yield and its contributing traits in wide-compatible elite rice (Oryza sativa L.) restorer lines. Journal of Experimental Biology and Agricultural Sciences, 12(6), 850–859. https://doi.org/10.18006/2024.12(6).850.859

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